Besides X-ray radiography widely used in NDT area, two other Nondestructive X-ray analytical techniques are also frequently used in material characterization -- X-ray fluorescence (XRF) and X-ray diffraction(XRD). XRF measures the emission of characteristic fluorescent X-rays from a material sample that has been excited by X-rays beam, and provides qualitative and quantitative elemental composition of material samples. XRD collects the X-ray diffraction pattern information and inversely calculates the crystallographic structure. XRF focus on elemental analysis, whereas XRD focus on compound/phase analysis.